Features

The ULTRA System is very flexible and provides the user with the capability to optimise test programs for Speed, Accuracy or a combination of these depending on individual requirements. Three alternative continuity algorithms are provided. These are: Point to Point, Parallel and Binary Chop.

         Point to Point:

This check tests each network against each other network, one at a time.

Parallel:

This check is quicker than a point-to-point check and is used to verify that each network is not shorted to any other network. Test time is reduced by connecting all other networks than the one being checked in parallel.

Binary Chop:

This is the fastest check. To reduce test time to an absolute minimum, networks are separated into drives and senses and tested against each other in parallel groups. Should the test fail, then diagnosis is automatically achieved using the parallel test

The quality of connectivity test can also be selected to suit individual requirements. A choice is available to test using a simple comparative technique or use an integrated over time resistance method.

Component Verification

Many Complex Cable Harness assemblies and Backplanes are increasingly being designed using passive and active components. The ULTRA provides the capability to test a wide range of these components including: 

Resistors

Tests individual resistors between any two points in the range: 5mΩ to 1000MΩ.

Dual Terminator Resistors

Tests dual terminator resistors between any point and the power and ground rails. Dual thresholds are programmable anywhere in the resistance range: 5mΩ to 1000MΩ.

Capacitors

Allows for the testing of individual capacitors between any two points over the capacitance range: 100pF to 1,000µF.

Inductors

Allows for the individual testing of inductors between any two points in the range: 5mH to 1H.

Diodes

Tests individual Silicon, Germanium, Schottky, LED, Zener and Transorb diodes between any two points.

Transistors

Tests individual Transistors using the Guard Highway.

Impedance

Test for the individual impedance between any two points in the range: 1Ω to 1MΩ.

Fault Reporting

Concise and Full Fault reporting can be selected. Faults can be reported by simply indicating if networks are connected or not connected, or shown together with the failing measured resistance. When the binary chop or parallel algorithm is being used, the messages produced when errors are detected can be displayed in full mode or suppressed in favor of the final diagnosis in concise mode. 

Automatic Test Generation using CAD Data

To minimise the time and possible errors when generating a test program manually, the ULTRA Software Conversion Utility is provided to automate the process of test generation. Continuity and Component tests can be generated from CAD data.

Test Program Generation using Learning

As an alternative to automatic test generation, a self learn facility is provided. Two algorithms can be used –Point to Point or Binary Chop. For most applications the Binary Chop method provides the fastest means of learning connectivity. The slower Point-to-Point algorithm can be used where there are many parallel paths and the resistance threshold to be learned is very small. A choice of fast or high accuracy measurements can be selected to trade off between speed of learning and the need for accuracy if the threshold is close to the working resistance of the paths. 

Test Probe